Scientist using an atomic force microscope. This is a very high-resolution form of scanning probe microscopy used for imaging, measuring, and manipulating matter at the nanoscale. The information is gathered by "feeling" the surface with a mechanical probe.
| px | px | dpi | = | cm | x | cm | = | MB |
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Creative#:
TOP22297865
Source:
達志影像
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RM
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須由TPG 完整授權
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No
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No
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No
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