![](https://nthumb.tpgimages.com/mid2_com_img/28103/24054/TOP22297865.jpg)
Scientist using an atomic force microscope. This is a very high-resolution form of scanning probe microscopy used for imaging, measuring, and manipulating matter at the nanoscale. The information is gathered by "feeling" the surface with a mechanical probe.
px | px | dpi | = | cm | x | cm | = | MB |
Details
Creative#:
TOP22297865
Source:
達志影像
Authorization Type:
RM
Release Information:
須由TPG 完整授權
Model Release:
No
Property Release:
No
Right to Privacy:
No
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