![](https://nthumb.tpgimages.com/mid2_com_img/28103/24053/TOP22295627.jpg)
At Argonne's Center for Nanoscale Materials, Alexandre Imre (Nanofabrication & Devices Group) examines the specimen stage of the FEI Nova NanoLab FIB/SEM instrument: small specimens or full wafers up to 6 inches to be processed by the ion beam.
px | px | dpi | = | cm | x | cm | = | MB |
Details
Creative#:
TOP22295627
Source:
達志影像
Authorization Type:
RM
Release Information:
須由TPG 完整授權
Model Release:
No
Property Release:
No
Right to Privacy:
No
Same folder images: